X-ray Diffractometer for Crystal Orientation determination

A X-ray diffractometer for orientation measurements of single crystals is needed for routine operation by technicians in a crystal preparation laboratory. Brief technical description: - compact desktop device - automatic lattice orientation determination of single crystals (including Si, Ge, diamond, quartz, sapphire, LiNbO3, SiC). - determination of the surface orientation - determination of flat orientation- for samples ranging from millimeter size, wafers and ingots up to 300 mm diameter , with a weight from grams to 10 kg. - measurement errors for orientation angles <= 0.02° - measurement errors for flat orientation <= 0.02° - fast (< 1 minute) orientation determination - the system must be delivered with French certificate of conformity according to NF C 74-100